中图分类号:TM93 文献标志码:A DOI: 10.16157/j.issn.0258-7998.257399 中文引用格式: 韩奥,谭小林,吴仕坤,等. 用于电子束设备的微电流检测系统[J]. 电子技术应用,2026,52(4):60-65. 英文引用格式: Han Ao,Tan Xiaolin,Wu Shikun,et al. Micro-current detection system for electron beam equipment[J]. Application of Electronic Technique,2026,52(4):60-65.
Micro-current detection system for electron beam equipment
Han Ao,Tan Xiaolin,Wu Shikun,Chen Zhanglong,Gong Xiaoliang
The 48th Research Institute of China Electronics Technology Group Corporation
Abstract: A micro-current detection system is designed in this paper, it can be used to detect the weak current signal of electron beam equipment from picoampere level to nanoampere level. The design uses a transimpedance amplifier I/V conversion circuit structure, considering device selection, circuit cascade amplification, pure power supply, filter noise reduction, embedded computing, shielding and grounding, etc., the picoampere-level micro-current is amplified. At the same time, a dual-range selection circuit is designed to expand the measurement range to the hundred-nana level, and the amplified electrical signal is collected and optimized by the MCU microprocessor. Experiments show that the system can realize the measurement of weak current signal, and can be adjusted to a large range, and the measurement error is less than 0.5%, and the linearity is excellent and the response is fast.
Key words : micro-current detection;transimpedance amplification;I/V conversion;bipolar power supply;multi-range measurement